University Of Wisconsin Madison - WI
Thin Film Deposition System Maintenance
Aixtron III- V MOCVD System Upgrade
Bid Close Date:
Government bid alerts, regional filters, and fast access to documents
Thin Film Deposition System Maintenance
Aixtron III- V MOCVD System Upgrade
Bid Close Date:
Thin Film Resistance Measurement
Resistivity Measurement System Suite, 4- Point Probe - Item Descripiton: Resistivity Measurement System Suite, 4- Point Probe for the Troop Support Product Test Center.
Thin Film Deposition
CPE CBRND Seeking Physical Vapor Deposition ( PVD) of Silicon Dioxide ( SiO2) on Aluminum Flakes for Screening Obscuration Module - Multispectral ( SOM- M) - 1. 0 Disclaimer This Request for Information ( RFI) is issued solely for information and planning purposes. It does not constitute a Request for Proposal ( RFP) or a promise to issue an RFP in the future. This RFI does not co
Request for Information ( RFI) for physical vapor deposition ( PVD) of silicon dioxide ( SiO2) on aluminum flakes for the Screening Obscuration Module - Multispectral ( SOM- M) program Physical vapor deposition ( PVD) coating of silicon dioxide ( SiO2) onto aluminum flakes sized 2- 4 microns, scalable production from hundreds of pounds to tons
Bid Close Date:
Thin Film Deposition Equipment
Sputter Coater - Award was made on a trade- off basis and in accordance with the solicitation.
GaN/SiC wafers - NRL NOTICE OF INTENT TO AWARD A SOLE SOURCE This Notice of Intent is not a request for competitive proposals. This is not a solicitation or request for offers. No solicitation package is available and em
Procurement of gallium nitride ( GaN) epitaxial thin film layers grown on 100 mm diameter SiC substrates Gallium nitride ( GaN) epitaxial thin film layers on 100 mm diameter SiC substrates
Bid Close Date:
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