Dept Of Defense- Defense Logistics Agency- Dcso- Dcso Energy- Dcso- Columbus- Division- 2
Xray Fluorescence
Handheld X- Ray Fluorescence ( XRF) Analyzer - This requirement is for a Handheld X- Ray Fluorescence ( XRF) Analyzer to expand the Product Test Center s ( PTC) testing capabilities. This portable instrument will enable the PTC to make determinations on composition of metal alloys and coati
solicitationcontractorder for commercial items see schedule use reverse andor attach additional sheets as necessary
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Dept Of Defense- Defense Logistics Agency- Dcso- Dcso Energy- Dcso- Columbus- Division- 2
Handheld X- Ray Fluorescence ( XRF) Analyzer - IMPORTANT: This posting is a pre- solicitation notice only for an upcoming solicitation. No response is necessary. A formal solicitation, which will be open to quotes/responses, will be posted at a later time.
to obtain a handheld xray fluorescence xrf analyzer to expand the product testcenters ptc testing capabilities for its customers.
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Interior, Department Of The- Us Geological Survey- Office Of Acquisiton Grants
B-- X- ray fluorescence - Sources Sought ( Special Notice) The U. S. Geological Survey ( USGS) is conducting market research to determine the availability of qualified businesses capable of providing X- ray fluoresecence scanning described in the attached statement
xray fluoresecence scanning described in the attached statement of work. approximately 10 split cores will be scanned at 1mm sampling interval for detection of light atomic weight elements al, si, p, s, cl, k, ca, ti, cr, mn, fe, and 7 cores will be scanned at 1mm sampling interval for detection of medium atomic weight elements cu, zn, ga, br, rb, sr, y, zr, nb, mo, pb, bi.
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Commerce, Department Of- National Institute Of Standards And Technology- Dept Of Commerce Nist
Xray Fluorescence
Nanometer Scale Planar Films and Measurements - Per the attached Sources Sought Notice.
Nanometer- scale planar films and measurements hfo2 on si substrate, either: 200 mm prime double side polished si wafers, semi standards, or 300 mm prime double side polished si wafers, semi standards 4 nm to 10 nm hfo2, with 10 thickness uniformity across wafer, deposited by atomic layer deposition ald. minimum lot size: 10 wafers parameters configurable at time of order hfo2 thickness, optimized to vendors recipe lot size: minimum order quantity if 10 wafers, but additional wafers of the same lot may be ordered with an additional per wafer cost. wafer metrology characterization data xrr or equivalent: measurement data sets for at least five points, per wafer, and can be specified as an additional cost per wafer or per point. optional xrr, xrf, xps, se or other method: measurement data sets for at least five points, per wafer, preferably the same wafer locations as the primary measurement method and can be specified as an additional cost per wafer or per point. tin on si fixed parameters substrate, either: 2
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Energy, Department Of- Energy, Department Of- Ornl Ut- Battelle Llc- Doe Contractor
Advanced X- ray Analysis for Additive Manufacturing - Advanced X- ray Analysis for Additive Manufacturing Conduct a correlative analysis of the manufacturing process alongside chemical and structural characterization data to establish the relationship between process, structur
6 106 cps overall crossinstrument correlative sample capability either through existing software or through api access across the systems in this rfi data analysis software capable of automated wholepattern and cluster analysis with autogenerated reporting the system must use a noneproprietary data format system must have a footprint less than 1. 5 x 1. 5 meters statement of work advanced xray analysis for additive manufacturing dated april 24, 2025xray fluorescence xrf system: the system must contain both wavelengthdispersive and energydispersive xrf and can be ran in parallel the system must have the ability to change samples without venting of the optical chamber each time the system must have an integrated xyx sample changer and allow for unattended operation the system must be able to swap samples without the need to deenergize xray tube the system must have a minimum of a 2. 4 kw xray tube the system must contain a minimum of 3 different crystal types for elemental analysis the system must contain a hig
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