Commerce, Department Of- National Institute Of Standards And Technology- Dept Of Commerce Nist
Commercial semi- automatic probe stations - NIST- SS26- CHIPS- 44 PLEASE NOTE THIS A SOURCES SOUGHT NOTICE ONLY Title: Commercial semi- automatic probe stations BACKGROUND Silicon carbide field eff
commercial semi automatic probe stations line item ****: description: insert brief description of item e. g. optical table, part number quantity: 1 technical specifications must be a semiautomatic wafer probing station capable of probing wafers up to 300 mm in diameter must be capable of probing both whole wafers and pre diced dies must be four probes capable of probing pad sizes as small as 40 m x 40 m, with a pitch of 60 m. probes must have magnetic bases. must be compatible with and include low noise, blade style probe tips must include a heated wafer chuck capable of reaching temperatures of at least 200 degrees celsius must include digital microscope capable of imaging 5 m features must include user friendly software for control of probing and microscope manipulation must include vibration isolation
Bid Close Date: